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Thermal-aware task scheduling at the system software level
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International Symposium on Low Power Electronics and Design archive
Proceedings of the 2007 international symposium on Low power electronics and design table of contents
Portland, OR, USA
SESSION: DVS and thermal management table of contents
Pages: 213 - 218  
Year of Publication: 2007
ISBN:978-1-59593-709-4
Authors
Jeonghwan Choi  IBM T.J. Watson Research center, Yortown Heights, NY
Chen-Yong Cher  IBM T.J. Watson Research center, Yortown Heights, NY
Hubertus Franke  IBM T.J. Watson Research center, Yortown Heights, NY
Henrdrik Hamann  IBM T.J. Watson Research center, Yortown Heights, NY
Alan Weger  IBM T.J. Watson Research center, Yortown Heights, NY
Pradip Bose  IBM T.J. Watson Research center, Yortown Heights, NY
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this paper, the impact of thermal effects on low-power repeater insertion methodology is studied. An analytical methodology for thermal-aware repeater insertion that includes the electrothermal coupling between power, delay, and temperature is presented, and simulation results with global interconnect repeaters are discussed for 90nm and 65nm technology. Simulation results show that the proposed thermal-aware methodology can save 17.5% more power consumed by the repeaters compared to a thermal-unaware methodology for a given allowed delay penalty. In addition, the proposed methodology also results in a lower chip temperature, and thus, extra leakage power savings from other logic blocks.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Jeonghwan Choi: colleagues
Chen-Yong Cher: colleagues
Hubertus Franke: colleagues
Henrdrik Hamann: colleagues
Alan Weger: colleagues
Pradip Bose: colleagues