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Comparative analysis of conventional and statistical design techniques
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 44th annual Design Automation Conference table of contents
San Diego, California
SESSION: Statistical techniques for timing analysis and design table of contents
Pages: 238 - 243  
Year of Publication: 2007
ISBN ~ ISSN:0738-100X , 978-1-59593-627-1
Authors
Steven M. Burns  Intel Corporation, Hillsboro, OR
Mahesh Ketkar  Intel Corporation, Hillsboro, OR
Noel Menezes  Intel Corporation, Hillsboro, OR
Keith A. Bowman  Intel Corporation, Hillsbor, OR
James W. Tschanz  Intel Corporation, Hillsbor, OR
Vivek De  Intel Corporation, Hillsbor, OR
Sponsors
: The EDA Consortium
: IEEE/CASS/CANDE/CEDA
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 47,   Citation Count: 3
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ABSTRACT

We explore the power benefits of changing a microprocessor path histogram through circuit sizing based on statistical timing analysis and optimization (STAO) versus a deterministic timing approach that uses statistical design to establish a global guardband followed by conventional optimization (SDGG). Using an analytical modeling approach, we quantify the differences in total power between the two approaches while maintaining an equivalent performance distribution. For a relative 1σ random WID stage delay variation of 5% and representative microprocessor critical paths, the analysis indicates that the STAO approach enables ~2% power reduction over the SDGG approach. To achieve a 4% and 6% power reduction through the STAO approach, the process variation needs to increase by a factor of 2x and 4x, respectively.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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J. Tschanz, J. Kao, S. Narendra, R. Nair, D. Antoniadis, A. Chandrakasan, and V. De. Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage. IEEE J. Solid-State Circuits, pages 1396--1402, Nov. 2002.
 
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J. Tschanz, S. Narendra, R. Nair, and V. De. Effectiveness of adaptive supply voltage and body bias for reducing impact of parameter variations in low power and high performance microprocessors. IEEE J. Solid-State Circuits, pages 826--829, May 2003.
 
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Collaborative Colleagues:
Steven M. Burns: colleagues
Mahesh Ketkar: colleagues
Noel Menezes: colleagues
Keith A. Bowman: colleagues
James W. Tschanz: colleagues
Vivek De: colleagues