| Comparative analysis of conventional and statistical design techniques |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 44th annual Design Automation Conference
table of contents
San Diego, California
SESSION: Statistical techniques for timing analysis and design
table of contents
Pages: 238 - 243
Year of Publication: 2007
ISBN ~ ISSN:0738-100X , 978-1-59593-627-1
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Authors
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Steven M. Burns
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Intel Corporation, Hillsboro, OR
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Mahesh Ketkar
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Intel Corporation, Hillsboro, OR
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Noel Menezes
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Intel Corporation, Hillsboro, OR
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Keith A. Bowman
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Intel Corporation, Hillsbor, OR
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James W. Tschanz
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Intel Corporation, Hillsbor, OR
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Vivek De
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Intel Corporation, Hillsbor, OR
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Downloads (6 Weeks): 2, Downloads (12 Months): 47, Citation Count: 3
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ABSTRACT
We explore the power benefits of changing a microprocessor path histogram through circuit sizing based on statistical timing analysis and optimization (STAO) versus a deterministic timing approach that uses statistical design to establish a global guardband followed by conventional optimization (SDGG). Using an analytical modeling approach, we quantify the differences in total power between the two approaches while maintaining an equivalent performance distribution. For a relative 1σ random WID stage delay variation of 5% and representative microprocessor critical paths, the analysis indicates that the STAO approach enables ~2% power reduction over the SDGG approach. To achieve a 4% and 6% power reduction through the STAO approach, the process variation needs to increase by a factor of 2x and 4x, respectively.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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J. Tschanz, J. Kao, S. Narendra, R. Nair, D. Antoniadis, A. Chandrakasan, and V. De. Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage. IEEE J. Solid-State Circuits, pages 1396--1402, Nov. 2002.
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J. Tschanz, S. Narendra, R. Nair, and V. De. Effectiveness of adaptive supply voltage and body bias for reducing impact of parameter variations in low power and high performance microprocessors. IEEE J. Solid-State Circuits, pages 826--829, May 2003.
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CITED BY 3
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Vivek Joshi , Brian Cline , Dennis Sylvester , David Blaauw , Kanak Agarwal, Leakage power reduction using stress-enhanced layouts, Proceedings of the 45th annual conference on Design automation, June 08-13, 2008, Anaheim, California
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