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Transition density, a stochastic measure of activity in digital circuits
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 28th ACM/IEEE Design Automation Conference table of contents
San Francisco, California, United States
Pages: 644 - 649  
Year of Publication: 1991
ISBN:0-89791-395-7
Author
Farid N. Najm  Semiconductor Process & Design Center, Texas Instruments Inc., MS 369, Dallas, Texas
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 11,   Downloads (12 Months): 33,   Citation Count: 68
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
A. Papoulis, Probability, Random Variables, and Stochastic Processes, 2nd Edition. New York, NY: McGraw-Hill Book Co., 1984.
 
2
E. Par~en, Stochastic Processes, San Francisco, CA: Holden-Day Inc., 1962.
 
3
D. R. Cox and H. D. Miller, The Theory of Stochastic Processes, New York" John Wiley & Sons Inc., 1968.
 
4
K. P. Parker and E. :I. McCluskey, "Probabilistic treatment of general combinational networks," IEEE Trans. Computers, pp. 668-670, June 1975.
 
5
S. C. Seth, L. Pan, and V. D. Agrawal, "PRE- DICT- probabilistic estimation of digital circuit testability," IEEE 15th Annual international Symposium or~ Fault-Tolerant Computing, Ann Arbor, MI, pp. 220-225, June 1985.
 
6
J. Savir, G. S. Ditlow, and P. H. Bardell, "Random pattern testability," IEEE Trans. Computers, pp. 79-90, January 1984.
 
7
 
8
S. Ercolani, M. Favalli, M. Damiani, P. Olivo, and B. Ricc6, "Estimate of signal probability in combinational logic networks," 1989 IEEE European Test Conference, pp. 132-138, 1989.
 
9
10
 
11
F. N. Sajm, R. Surch, P. Yang, and I. N. Hajj, UP~ob~bili~i~ ~imul~tio~ for ~eliability analy~i~ of CMOS VLSI circuits," IEEE Trans. Computer- Aided Design, pp. 439-450, April 1990 (Errata in July 1990).

CITED BY  68