Transition density, a stochastic measure of activity in digital circuits

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Transition density, a stochastic measure of activity in digital circuits

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 28th ACM/IEEE Design Automation Conference table of contents

San Francisco, California, United States

Pages: 644 - 649

Year of Publication: 1991

ISBN:0-89791-395-7

Author

Farid N. Najm

Semiconductor Process & Design Center, Texas Instruments Inc., MS 369, Dallas, Texas

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society

Publisher

ACM New York, NY, USA

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Downloads (6 Weeks): 5, Downloads (12 Months): 32, Citation Count: 68

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references cited by index terms collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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