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A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Nice, France
SESSION: Order reduction and variation-aware interconnect modelling table of contents
Pages: 1514 - 1519  
Year of Publication: 2007
ISBN:978-3-9810801-2-4
Authors
Hengliang Zhu  Fudan University, Shanghai, P.R. China
Xuan Zeng  Fudan University, Shanghai, P.R. China
Wei Cai  University of North Carolina at Charlotte
Jintao Xue  Fudan University, Shanghai, P.R. China
Dian Zhou  Fudan University, Shanghai, P.R. China and The University of Texas at Dallas
Sponsors
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
: The EDA Consortium
EDAA : European Design and Automation Association
RAS : RAS
: The IEEE Computer Society TTTC
: ECSI
Publisher
EDA Consortium  San Jose, CA, USA
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Downloads (6 Weeks): 9,   Downloads (12 Months): 40,   Citation Count: 3
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ABSTRACT

In this paper, a Spectral Stochastic Collocation Method (SSCM) is proposed for the capacitance extraction of interconnects with stochastic geometric variations for nanometer process technology. The proposed SSCM has several advantages over the existing methods. Firstly, compared with the PFA (Principal Factor Analysis) modeling of geometric variations, the K-L (Karhunen-Loeve) expansion involved in SSCM can be independent of the discretization of conductors, thus significantly reduces the computation cost. Secondly, compared with the perturbation method, the stochastic spectral method based on Homogeneous Chaos expansion has optimal (exponential) convergence rate, which makes SSCM applicable to most geometric variation cases. Furthermore, Sparse Grid combined with a MST (Minimum Spanning Tree) representation is proposed to reduce the number of sampling points and the computation time for capacitance extraction at each sampling point. Numerical experiments have demonstrated that SSCM can achieve higher accuracy and faster convergence rate compared with the perturbation method.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Hengliang Zhu: colleagues
Xuan Zeng: colleagues
Wei Cai: colleagues
Jintao Xue: colleagues
Dian Zhou: colleagues