ACM Home Page
Please provide us with feedback. Feedback
Verification-guided soft error resilience
Full text PdfPdf (241 KB)
Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Nice, France
SESSION: Soft error evaluation and tolerance table of contents
Pages: 1442 - 1447  
Year of Publication: 2007
ISBN:978-3-9810801-2-4
Authors
Sanjit A. Seshia  UC Berkeley
Wenchao Li  UC Berkeley
Subhasish Mitra  Stanford University
Sponsors
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
: The EDA Consortium
EDAA : European Design and Automation Association
RAS : RAS
: The IEEE Computer Society TTTC
: ECSI
Publisher
EDA Consortium  San Jose, CA, USA
Bibliometrics
Downloads (6 Weeks): 8,   Downloads (12 Months): 44,   Citation Count: 3
Additional Information:

abstract   references   cited by   collaborative colleagues  

Tools and Actions: Review this Article  

ABSTRACT

Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Cadence SMV model checker. http://www.kenmcmil.com/smv.html.
 
2
SpaceWire Verilog. http://www.opencores.org/projects.cgi/web/spacewire/overview, July 2005.
 
3
IEEE P1850 - standard for PSL - property specification language. http://www.eda.org/ieee-1850/, URL circa Sep.'06.
 
4
 
5
R. C. Baumann. The impact of technology scaling on soft error rate performance and limits to the efficiency of error correction. In Proc. IEDM, pages 329--332, 2002.
 
6
H. Chockler, O. Kupferman, and M. Y. Vardi. Coverage metrics for formal verification. In Proc. CHARME, LNCS 2860, pages 111--125, 2003.
 
7
E. M. Clarke, O. Grumberg, and D. A. Peled. Model Checking. MIT Press, 2000.
 
8
European Cooperation for Space Standardization. Space engineering - SpaceWire - links, nodes, routers, and networks (draft ECSS-E-50-12A). http://www.spacewire.esa.int/tech/spacewire/standards/, November 2002.
 
9
10
 
11
 
12
 
13
 
14
 
15
16
 
17
M. Nicolaidis. Design for soft error mitigation. IEEE Trans. Device and Matl. Reliability, 5(3):405--418, Sept. 2005.
 
18
 
19
 
20
M. Zhang, S. Mitra, T. M. Mak, N. Seifert, Q. Shi, K. Kim, N. Shanbhag, N. Wang, and S. Patel. Sequential element design with built-in soft error resilience. IEEE Transactions on VLSI, Dec. 2006.

Collaborative Colleagues:
Sanjit A. Seshia: colleagues
Wenchao Li: colleagues
Subhasish Mitra: colleagues