ACM Home Page
Please provide us with feedback. Feedback
Thermally robust clocking schemes for 3D integrated circuits
Full text PdfPdf (249 KB)
Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Nice, France
SESSION: Interconnect extraction and synthesis table of contents
Pages: 1206 - 1211  
Year of Publication: 2007
ISBN:978-3-9810801-2-4
Authors
Mosin Mondal  Rice University, Houston, TX
Andrew J. Ricketts  Pennsylvania State University, University Park, PA
Sami Kirolos  Rice University, Houston, TX
Tamer Ragheb  Rice University, Houston, TX
Greg Link  York College of Pennsylvania, York, PA
N. Vijaykrishnan  Pennsylvania State University, University Park, PA
Yehia Massoud  Rice University, Houston, TX
Sponsors
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
: The EDA Consortium
EDAA : European Design and Automation Association
RAS : RAS
: The IEEE Computer Society TTTC
: ECSI
Publisher
EDA Consortium  San Jose, CA, USA
Bibliometrics
Downloads (6 Weeks): 9,   Downloads (12 Months): 42,   Citation Count: 1
Additional Information:

abstract   references   cited by   collaborative colleagues  

Tools and Actions: Review this Article  

ABSTRACT

3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical connections between layers. However, dissipating the heat generated in the 3D chips possesses a major challenge to the success of the technology and is the subject of active current research. Since the generated heat degrades the performance of the chip, thermally insensitive/adaptive circuit design techniques are required for better overall system performance. In this paper, we propose a thermally adaptive 3D clocking scheme that dynamically adjusts the driving strengths of the clock buffers to reduce the clock skew between terminals. We investigate the relative merits and demerits of two alternative clock tree topologies in this work. Simulation results demonstrate that our adaptive technique is capable of reducing the skew by 61.65% on the average, leading to much improved clock synchronization and design performance in the 3D realm.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
H. Kurino et. al., "Intelligent Image Sensor Chip with Three Dimensional Structure," in Proceedings of International Electron Devices Meeting (IEDM), pp. 879--882, 1999.
 
2
 
3
 
4
R. H. Havemann and J. A. Hutchby, "High-Performance Interconnects: An Integration Overview," in Proceedings of IEEE, vol. 89, pp. 586--601, May 2001.
 
5
K. Banerjee, S. J. Souri, P. Kapur, and K. C. Saraswat, "3-D ICs: A Novel Chip Design for Improving Deep-Submicrometer Interconnect Performance and Systems-on-Chip Integration," in Proceedings of the IEEE, vol. 89, pp. 602--633, May 2001.
6
 
7
 
8
A. H. Ajami, K. Banerjee, and M. Pedram, "Modeling and Analysis of Non-Uniform Substrate Temperature Effects in High Performance VLSI," in IEEE Transactions on Computer Aided Design, vol. 24, no. 6, pp. 849--861, 2001.
 
9
 
10
 
11
 
12
H. Heeb and A. Ruehli, "Three-Dimensional Interconnect Analysis Using Partial Element Equivalent Circuits," in IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, pp. 974--982, November 1992.
 
13
M. Kamon, M. J. Tsuk, and J. White, "Fasthenry: A Multipole-Accelerated 3-D Inductance Extraction Program," in IEEE Transactions on Microwave Theory and Techniques, pp. 1750--1758, September 1994.
 
14
K. Nabors and J. White, "Fastcap: A Multipole Accelerated 3-D Capacitance Extraction Program," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 10, pp. 1447--1459, November 1991.
 
15
A. Ruehli, "Inductance Calculations in a Complex Integrated Circuit Environment," in IBM J. Res. Dev., vol. 16, no. 5, pp. 470--481, 1972.
 
16
Y. Massoud and Y. Ismail, "Grasping the Impact of On-chip Inductance," in IEEE Circuits and Devices Magazine, vol. 17, no. 4, pp. 14--21, July 2001.
 
17
 
18
M. Pertijs, K. Makinwa, and J. Huijsing, "A CMOS Smart Temperature Sensor with a 3σ Inaccuracy of ±0.1μ C from -- 55° C to 125° C," in IEEE Journal of Solid-State Circuits, vol. 40, December 2005.
 
19
 
20
 
21
S. Im and K. Banerjee, "Full Chip Thermal Analysis of Planar (2-D) and Vertically Integrated (3-D) High Performance ICs," in Technical Digest of IEDM, pp. 727--730, 2000.
 
22
A. Ajami, K. Banerjee, and M. Pedram, "Modeling and Analysis of Nonuniform Substrate Temperature Effects on Global ULSI Interconnects," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 24, pp. 849--861, 2005.

Collaborative Colleagues:
Mosin Mondal: colleagues
Andrew J. Ricketts: colleagues
Sami Kirolos: colleagues
Tamer Ragheb: colleagues
Greg Link: colleagues
N. Vijaykrishnan: colleagues
Yehia Massoud: colleagues