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Bottom-k sketches: better and more efficient estimation of aggregates
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Joint International Conference on Measurement and Modeling of Computer Systems archive
Proceedings of the 2007 ACM SIGMETRICS international conference on Measurement and modeling of computer systems table of contents
San Diego, California, USA
POSTER SESSION: Poster session table of contents
Pages: 353 - 354  
Year of Publication: 2007
ISBN:978-1-59593-639-4
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Authors
Edith Cohen  AT&T Labs-Research
Haim Kaplan  Tel Aviv University
Sponsors
SIGMETRICS: ACM Special Interest Group on Measurement and Evaluation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 18,   Citation Count: 6
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ABSTRACT

A Bottom-k sketch is a summary of a set of items with nonnegative weights. Each such summary allows us to compute approximate aggregates over the set of items. Bottom-k sketches are obtained by associating with each item in a ground set an independent random rank drawn from a probability distribution that depends on the weight of the item. For each subset of interest, the bottom-k sketch is the set of the k minimum ranked items and their ranks. Bottom-k sketches have numerous applications. We develop and analyze data structures and estimators for bottom-k sketches to facilitate their deployment. We develop novel estimators and algorithms that show that they are a superior alternative to other sketching methods in both efficiency of obtaining the sketches and the accuracy of the estimates derived from the sketches.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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E. Cohen and H. Kaplan. Sketches and estimators for subpopulation weight queries. Manuscript, 2007.
 
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E. Cohen and H. Kaplan. Summarizing data using bottom-k sketches. Manuscript, 2007.
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Collaborative Colleagues:
Edith Cohen: colleagues
Haim Kaplan: colleagues