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Sensitivity of software system reliability to usage profile changes
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Source Symposium on Applied Computing archive
Proceedings of the 2007 ACM symposium on Applied computing table of contents
Seoul, Korea
SESSION: Software engineering table of contents
Pages: 1440 - 1444  
Year of Publication: 2007
ISBN:1-59593-480-4
Authors
Kim Weyns  Lund University, Lund, Sweden
Per Runeson  Lund University, Lund, Sweden
Sponsor
SIGAPP: ACM Special Interest Group on Applied Computing
Publisher
ACM  New York, NY, USA
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ABSTRACT

Usage profiles are an important factor in software system reliability estimation. To assess the sensitivity of a system's reliability to changes in the usage profile, a Markov based system model is used. With the help of this model, the statistical sensitivity to many independent changes can be estimated. The theory supports both absolute and relative changes and can be used for systems with or without a terminal state. With this approach it is possible to very quickly estimate the uncertainty on the predicted reliability calculated from a Markov model based upon the uncertainty on the usage profile. Finally the theory is applied to an example to illustrate its use and to show its validity.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
R. C. Cheung. A user-oriented software reliability model. IEEE Transactions on Software Engineering, 6(2):118, 1980.
 
2
K. Goševa-Popstojanova and S. Kamavaram. Software reliability estimation under uncertainty:generalization of the method of moments. Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings., pages 209--218, 2004.
 
3
 
4
 
5
 
6
J. Musa. Adjusting measured field failure intensity for operational profile variation. 5th International Symposium on Software Reliability Engineering, 1994. Proceedings., pages 330--333, 1994.
 
7
J. Musa. Sensitivity of field failure intensity to operational profile errors. 5th International Symposium on Software Reliability Engineering, 1994. Proceedings., pages 334--337, 1994.
 
8
A. Pasquini, A. Crespo, and P. Matrella. Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy. IEEE Transactions on Reliability, 45(4):531--540, 1996.
 
9
 
10
 
11
 
12
 
13
S. Yacoub, B. Cukic, and H. Ammar. A scenario-based reliability analysis approach for component-based software. IEEE Transactions on Reliability, 53(4):465--480, 2004.