ACM Home Page
Please provide us with feedback. Feedback
Test conditions for fault classes in Boolean specifications
Full text PdfPdf (108 KB)
Source
ACM Transactions on Software Engineering and Methodology (TOSEM) archive
Volume 16 ,  Issue 3  (July 2007) table of contents
Article No. 10  
Year of Publication: 2007
ISSN:1049-331X
Authors
Kalpesh Kapoor  Dhirubhai Ambani Institute of Information and Communication Technology, Gandhinagar (Gujarat), India
Jonathan P. Bowen  Museophile Limited, Oxon, United Kingdom
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 10,   Downloads (12 Months): 97,   Citation Count: 1
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1243987.1243988
What is a DOI?

ABSTRACT

Fault-based testing of software checks the software implementation for a set of faults. Two previous papers on fault-based testing [Kuhn 1999; Tsuchiya and Kikuno 2002] represent the required behavior of the software as a Boolean specification represented in Disjunctive Normal Form (DNF) and then show that faults may be organized in a hierarchy. This article extends these results by identifying necessary and sufficient conditions for fault-based testing. Unlike previous solutions, the formal analysis used to derive these conditions imposes no restrictions (such as DNF) on the form of the Boolean specification.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
DeMillo, R. A., Lipton, R. J., and Sayward, F. G. 1978. Hints on test data selection: Help for the practicing programmer. IEEE Computer 11, 4 (April), 34--41.
 
2
 
3
4
 
5
IEEE. 1990. IEEE Standard Glossary of Software Engineering Terminology, ANSI/IEEE Std. 610.12. New York: Institute of Electrical and Electronics Engineers.
 
6
Kapoor, K. and Bowen, J. P. 2004. Ordering mutants to minimise test effort in mutation testing. In 4th International Workshop, Formal Approaches to Software Testing (FATES). Lecture Notes in Computer Science, vol. 3395. Springer-Verlag, 195--209.
 
7
8
9
 
10
11
 
12
 
13
Okun, V., Black, P. E., and Yesha, Y. 2004. Comparison of fault classes in specification-based testing. Inform. Softw. Tech. 46, 8 (June), 525--533.
 
14
Paradkar, A., Tai, K. C., and Vouk, M. A. 1996. Automatic test-generation for predicates. IEEE Trans. Reliab. 45, 4 (Dec.), 515--530.
 
15
 
16
RTCA. 1992. Software Considerations in Airborne Systems and Equipment Certification, DO-178B. Washington DC, USA.
 
17
18
 
19
 
20
Vouk, M. A., Tai, K. C., and Paradkar, A. 1994. Empirical studies of predicate-based software testing. In 5th International Symposium on Software Reliability Engineering. IEEE Computer Society, 55--64.
 
21
 
22
Weyuker, E. J. 2002. Thinking formally about testing without a formal specification. In Formal Approaches to Testing of Software (FATES), A Satellite Workshop of CONCUR'02. 1--10.
 
23
 
24
25


Collaborative Colleagues:
Kalpesh Kapoor: colleagues
Jonathan P. Bowen: colleagues