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Molecular organic electronic circuits
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Source International Conference on Computer Aided Design archive
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Embedded tutorial: integrating nanoelectronics, biotechnology and MEMS/NEMS table of contents
Pages: 830 - 831  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Vladimir Bulovi  Microsystems Technology Laboratories, Cambridge, MA
Kevin Ryu  Microsystems Technology Laboratories, Cambridge, MA
Charles G. Sodini  Microsystems Technology Laboratories, Cambridge, MA
Ioannis Kymissis  Columbia University, New York, NY
Annie Wang  Microsystems Technology Laboratories, Cambridge, MA
Ivan Nausieda  Microsystems Technology Laboratories, Cambridge, MA
Akintunde Ibitayo Akinwande  Microsystems Technology Laboratories, Cambridge, MA
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Electronic energy disorder associated within amorphous and polycrystaline molecular organic thin film structures strongly affects the macroscopic observable behavior of organic field effect transistors (OFET) and poses practical challenges to implementing OFET circuits. It has been convenient to ignore the detailed physical processes associated with this disorder and model OFET behavior as equivalent to silicon FETs, but such simplifications limit our ability to develop integrated circuit technology as they fail to predict the true integrated OFET behavior. This talk will highlight the evolution of the organic electronic circuit technology and the challenges that lay ahead, emphasizing the need for physically accurate models of device behavior as the cornerstone of any future circuit advancements.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
I. Kymissis, C. G. Sodini, A. I. Akinwande, V. Bulović, IEDM Tech. Digest, 377 (2004).
 
2
T. Someya et al., IEEE Int'l. Solid State Circuits Conf. Dig. of Tech. Papers, 288 (2004).
 
3
I. Kymissis, A. I. Akinwande, V. Bulović, IEEE J. Display Tech. 1, 289 (2005).
 
4
K. Ryu, I. Kymissis, V. Bulović, C. G. Sodini, IEEE Electron Device Letters, <b>26</b>, 716 (2005).

Collaborative Colleagues:
Vladimir Bulovi: colleagues
Kevin Ryu: colleagues
Charles G. Sodini: colleagues
Ioannis Kymissis: colleagues
Annie Wang: colleagues
Ivan Nausieda: colleagues
Akintunde Ibitayo Akinwande: colleagues