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Automatic memory reductions for RTL model verification
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Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Advances in model checking table of contents
Pages: 786 - 793  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Panagiotis Manolios  Georgia Institute of Technology, Atlanta, Georgia
Sudarshan K. Srinivasan  Georgia Institute of Technology, Atlanta, Georgia
Daron Vroon  Georgia Institute of Technology, Atlanta, Georgia
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

We present several techniques for automatically reducing memories in RTL designs. This includes a new memory abstraction algorithm that allows us to greatly reduce the size of memories and a technique based on-term rewriting that further improves the abstraction. In contrast to previously proposed methods for abstracting memories of RTL designs, our methods are general---e.g., they allow us to arbitrarily and directly compare memories---and they are sound and complete---e.g., there are no false positives or negatives. In addition, the combination of our techniques allows us to automatically verify RTL pipelined machine designs beyond the reach of current state-of-the-art methods, as our experimental results show.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Panagiotis Manolios: colleagues
Sudarshan K. Srinivasan: colleagues
Daron Vroon: colleagues