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Nanowire addressing with randomized-contact decoders
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Source International Conference on Computer Aided Design archive
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Defect tolerance for nanoscale architectures table of contents
Pages: 735 - 742  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Eric Rachlin  Brown University, Providence, RI
John E. Savage  Brown University, Providence, RI
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 22,   Citation Count: 2
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ABSTRACT

Methods for assembling crossbars from nanowires (NWs) have been designed and implemented. Methods for controlling individual NWs within a crossbar have also been proposed, but implementation remains a challenge. A NW decoder is a device that controls many NWs with, a much smaller number of lithographically produced mesoscale wires (MWs). Unlike traditional demultiplexers, all proposed NW decoders are assembled stochastically. In a randomized-contact decoder (RCD) [11], for example, field-effect transistors are randomly created at about half of the NW/MW junctions.

In this paper, we tightly bound the number of MWs required to produce a correctly functioning RCD with high probability. We show that the number of MWs is logarithmic in the number of NWs, even when errors occur. We also analyze the overhead associated with controlling a stochastically assembled decoder. As we explain, lithographically-produced control circuitry must store information regarding which MWs control which NWs. This requires more area than the MWs themselves, but has received little attention elsewhere.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Eric Rachlin: colleagues
John E. Savage: colleagues