System-level process-driven variability analysis for single and multiple voltage-frequency island systems

ABSTRACT

The problem of determining bounds for application completion times running on generic systems comprised of single or multiple voltage-frequency islands (VFIs) with arbitrary topologies is addressed in the context of manufacturing-driven variability. The approach provides an exact solution for the system-level timing yield in single clock, single voltage (SSV) and VFI systems with an underlying tree-based topology, and a tight upper bound for generic, non-tree based topologies. The results show that: (a) timing yield for overall source-to- sink completion time for generic systems can be modeled in an exact manner for both SSV and VFI systems; and (b) multiple VFI, latency-constrained systems can achieve 11--90% higher timing yield than their SSV counterparts. The results are proven formally and supported by experimental results on two embedded applications, namely software defined radio and MPEG2 encoder.

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INDEX TERMS

Primary Classification:
  I. Computing Methodologies
  I.6 SIMULATION AND MODELING

Additional Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.2 Performance Analysis and Design Aids

General Terms:
Design, Performance

Keywords:
variability, voltage-frequency islands