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A linear-time approach for static timing analysis covering all process corners
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Source International Conference on Computer Aided Design archive
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Statistical timing analysis table of contents
Pages: 217 - 224  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Sari Onaissi  University of Toronto, Toronto, Ontario, Canada
Farid N. Najm  University of Toronto, Toronto, Ontario, Canada
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 6,   Downloads (12 Months): 23,   Citation Count: 4
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ABSTRACT

Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process corners (combinations of process parameter extremes) to make sure that circuit timing constraints are met at all corners, typically by running static timing analysis (STA) at every corner. This approach is becoming too expensive due to the exponential increase in the number of corners with modern processes. As an alternative, we propose a linear-time approach for STA which covers all process corners in a single pass. Our technique assumes a linear dependence of delay on process parameters and provides tight bounds on the worst-case circuit delay. It exhibits high accuracy (within 1-3%) in practice and, if the circuit has m gates and n relevant process parameters, the complexity of the algorithm is O(mn).


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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F. Brglez and H. Fujiwara. A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran. In IEEE International Symposium on Circuits and Systems (ISCAS-85), pages 663--698, June 1985.
 
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J. Quain, S. Pullela, and L. Pillage. Modeling the "effective capacitance" for the rc interconnect of cmos gates. IEEE Trans. on Computer-Aided Design, 13(12):1526--1535, 1994.
 
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Collaborative Colleagues:
Sari Onaissi: colleagues
Farid N. Najm: colleagues