Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques

ABSTRACT

An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustness of a logic gate is developed. This model -- in posynomial form -- is integrated with performance and power constraints into an optimization framework based on geometric programming for design space exploration. Simulation results for design optimization using simultaneous dual- VDD and gate sizing techniques for the 70 nm process technology demonstrate the tradeoffs that can be achieved with this approach.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.6 LOGIC DESIGN
      B.6.3 Design Aids
          Subjects: Optimization

Additional Classification:
  B. Hardware
  B.6 LOGIC DESIGN
      B.6.1 Design Styles
          Subjects: Combinational logic
      B.6.3 Design Aids
          Subjects: Simulation
  B.8 Performance and Reliability
      B.8.2 Performance Analysis and Design Aids

General Terms:
Design, Performance