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Handling inductance in early power grid verification
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Source International Conference on Computer Aided Design archive
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Power grid analysis and design table of contents
Pages: 127 - 134  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Nahi H. Abdul Ghani  University of Toronto, Toronto, Ontario, Canada
Farid N. Najm  University of Toronto, Toronto, Ontario, Canada
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

As part of integrated circuit design verification, one should check if the voltage drop on the power grid exceeds some critical threshold. One way to do this is by simulation, but that is computationally expensive and gets prohibitive for large circuits with a large variety of possible operational modes. Another limitation of a simulation-based approach is that it requires complete knowledge of the logic circuitry drawing current from the grid, thus precluding grid verification early in the design process. In this paper, we model the grid as an RLC circuit and we propose three verification techniques that can be applied in the early stages of the design process. These techniques do not require exact knowledge of the circuit currents. Instead, the currents drawn by the logic beneath the power grid are described by means of current constraints that capture the uncertainty about circuit details and activity. The first verification approach gives the exact worst-case voltage drop at every node of the grid, but it is slow. A second faster approach gives conservative bounds on the worst-case voltage drop at every node of the grid. The third approach is much faster; it is a conservative approach which simply checks if the grid voltage drop exceeds some pre-defined thresholds, without actually computing the worst-case voltage drop at every node.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Nahi H. Abdul Ghani: colleagues
Farid N. Najm: colleagues