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Early wire characterization for predictable network-on-chip global interconnects
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International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2007 international workshop on System level interconnect prediction table of contents
Austin, Texas, USA
SESSION: Advanced interconnect architectures table of contents
Pages: 57 - 64  
Year of Publication: 2007
ISBN:978-1-59593-622-6
Authors
Ilhan Hatirnaz  LSM: EPFL, Lausanne, Switzerland
Stephane Badel  LSM: EPFL, Lausanne, Switzerland
Nuria Pazos  LSM: EPFL, Lausanne, Switzerland
Yusuf Leblebici  LSM: EPFL, Lausanne, Switzerland
Srinivasan Murali  CSL, Stanford, CA
David Atienza  LSM: EPFL, Lausanne, Switzerland
Giovanni De-Micheli  LSM: EPFL, Lausanne, Switzerland
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

This work envisions a common design methodology, applicable for every interconnect level and based on early wire characterization, to provide a faster convergence to a feasible and robust design. We claim that such a novel design methodology is vital for upcoming nanometer technologies, where increased variations in both device characteristics and interconnect parameters introduce tedious design closure problems. The proposed methodology has been successfully applied to the wire synthesis of a Network-on-Chip interconnect to: (i) achieve a given delay and noise goals, and (ii) attain a more power-efficient design with respect to existing techniques.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Ilhan Hatirnaz: colleagues
Stephane Badel: colleagues
Nuria Pazos: colleagues
Yusuf Leblebici: colleagues
Srinivasan Murali: colleagues
David Atienza: colleagues
Giovanni De-Micheli: colleagues