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The influences of fault type and topology on fault model performance and the implications to test and testable design
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 27th ACM/IEEE Design Automation Conference table of contents
Orlando, Florida, United States
Pages: 673 - 678  
Year of Publication: 1991
ISBN:0-89791-363-9
Authors
Kenneth M. Butler  Dept. of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX
M. Ray Mercer  Dept. of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 12,   Citation Count: 3
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ABSTRACT

A new method, Difference Propagation, is proposed to analyze fault models in combinational circuits. It propagates Boolean functional information represented by ordered binary decision diagrams. Results are presented concerning exact detectabilities and syndromes for a set of benchmark circuits. The data suggest answers to open questions in CAD and represent the first data of this type for bridging faults. The information is shown to affect testable design as well as test generation.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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20
D. E. Ross, personal communication, Aug. 1989.
 
21
C-T. Hung, K. M. Butler and M. R. Mercer, unpublished manuscript, Apr. 1989.


Collaborative Colleagues:
Kenneth M. Butler: colleagues
M. Ray Mercer: colleagues