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ABSTRACT
A new method, Difference Propagation, is proposed to analyze fault models in combinational circuits. It propagates Boolean functional information represented by ordered binary decision diagrams. Results are presented concerning exact detectabilities and syndromes for a set of benchmark circuits. The data suggest answers to open questions in CAD and represent the first data of this type for bridging faults. The information is shown to affect testable design as well as test generation.
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Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 3
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Jennifer Dworak , Jason D. Wicker , Sooryong Lee , Michael R. Grimaila , M. Ray Mercer , Kenneth M. Butler , Bret Stewart , Li-C. Wang, Defect-Oriented Testing and Defective-Part-Level Prediction, IEEE Design & Test, v.18 n.1, p.31-41, January 2001
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