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Techniques for unit-delay compiled simulation
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 27th ACM/IEEE Design Automation Conference table of contents
Orlando, Florida, United States
Pages: 480 - 484  
Year of Publication: 1991
ISBN:0-89791-363-9
Authors
Peter M. Maurer  Department of Computer Science and Engineering, University of South Florida, Tampa, FL
Zhicheng Wang  Department of Computer Science and Engineering, University of South Florida, Tampa, FL
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 7,   Downloads (12 Months): 17,   Citation Count: 6
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ABSTRACT

The PC-set method and the parallel technique are two methods for performing compiled unit-delay simulation. The PC-set method analyzes the network, determines the set of potential change times for each net, and generates gate simulations for each potential change. The parallel technique, which is based on the concept of parallel fault simulation, is faster and generates less code than the PC-method, but is less flexible. Benchmark comparisons with interpreted event-driven simulation show a factor of four improvement for the PC-set method and a factor of ten improvement for the parallel technique.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Barzilai, Z., J. L. Carter, B. K. Rosen and J. D. Rutledge, "HSS -- A High Speed Simulator," IEEE Transactions on Computer-Aided Design, Vol. CAD-6, No. 4. July 1987, pp. 601-617.
 
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Chappell, S. G., H. Y. Chang, C. H. Elmendorf and L. D. Schmidt, "Comparison of Parallel and Deductive Simulation Techniques," IEEE Transactions on Computers, Vol C-23, pp. 1132-1139.
 
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R.E. Bryant, "Data Parallel Switch-Level Simulation," IEEE International Conference on Computer Aided Design, 1988, pp. 354-357.
 
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F. Brglez, P. Pownall, R. Hum, "Accelerated ATPG and Fault Grading via TestabiliIy Analy,~is," Proc ISCAS-85, pp. 695-698.


Collaborative Colleagues:
Peter M. Maurer: colleagues
Zhicheng Wang: colleagues