| Stochastic evolution: a fast effective heuristic for some generic layout problems |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 27th ACM/IEEE Design Automation Conference
table of contents
Orlando, Florida, United States
Pages: 26 - 31
Year of Publication: 1991
ISBN:0-89791-363-9
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Authors
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Youssef G. Saab
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Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, Illinois
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Vasant B. Rao
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Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, Illinois
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Downloads (6 Weeks): 8, Downloads (12 Months): 26, Citation Count: 5
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ABSTRACT
There are two canonical optimization problems, namely, NETWORK BISECTIONING (NB) and TRAVELING SALESMAN (TS), that emerge from the physical design and layout of integrated circuits. In this paper, we use an analogy between iterative techniques for combinatorial optimization and the evolution of biological species to obtain the Stochastic Evolution (SE) heuristic for solving a wide range of combinatorial optimization problems. We show that SE can be specifically tailored to solve both NB and TS. Experimental results for the NB and TS problems show that the SE algorithm produces better quality solutions and is faster than the Simulated Annealing algorithm in all instances considered.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Y. Saab and V. Rao, "Optimization by Stochastic Evolution," (submitted to) 1EEE Trans. Computer-Aided Design.
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CITED BY 5
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Chulho Shin , Young-Taek Kim , Eui-Young Chung , Kyu-Myung Choi , Jeong-Taek Kong , Soo-Kwan Eo, Fast Exploration of Parameterized Bus Architecture for Communication-Centric SoC Design, Proceedings of the conference on Design, automation and test in Europe, p.10352, February 16-20, 2004
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