| Estimating path delay distribution considering coupling noise |
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Great Lakes Symposium on VLSI
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Proceedings of the 17th ACM Great Lakes symposium on VLSI
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Stresa-Lago Maggiore, Italy
SESSION: Test and reliability
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Pages: 61 - 66
Year of Publication: 2007
ISBN:978-1-59593-605-9
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Authors
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Rajeshwary G. Tayade
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University of Texas at Austin, Austin, TX
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Vijay Kiran Kalyanam
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Advanced Micro Devices Inc., Austin, TX
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Sani Nassif
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IBM, Austin, TX
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Michael Orshansky
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University of Texas at Austin, Austin, TX
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Jacob Abraham
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University of Texas at Austin, Austin, TX
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Downloads (6 Weeks): 2, Downloads (12 Months): 28, Citation Count: 1
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ABSTRACT
Accurately estimating critical path delays is extremely important for yield optimization and for path selection in delay testing. It is well known that dynamic effects such ascoupling noise can significantly affect critical path delays. In traditional static timing analysis, the coupling effect isincorporated by estimating the switching window overlaps between aggressor and victim and then assuming a constant (worst case) coupling factor if any overlap is present. However in path based statistical timing analysis, using a constant coupling factor can overestimate the mean delay while under estimating the delay variance. In this paper, we propose a technique to estimate the dynamic variation in pathdelay caused by coupling noise. We treat the effective coupling capacitance as a random variable that varies as a function of the relative signal arrival times between victim andaggressor nodes. A modeling technique to estimate the capacitance variation is shown and a framework that gives therelative signal arrival time distribution at the victim nodesis developed.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Ravishankar Arunachalam , Karthik Rajagopal , Lawrence T. Pileggi, TACO: timing analysis with coupling, Proceedings of the 37th conference on Design automation, p.266-269, June 05-09, 2000, Los Angeles, California, United States
[doi> 10.1145/337292.337415]
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2
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Andrew B. Kahng , Sudhakar Muddu , Egino Sarto, On switch factor based analysis of coupled RC interconnects, Proceedings of the 37th conference on Design automation, p.79-84, June 05-09, 2000, Los Angeles, California, United States
[doi> 10.1145/337292.337318]
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3
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S. Sapatnekar, A Timing Model Incorporating the Effect of Crosstalk on Delay and its Application to Optimal Channel Routing, IEEE Tran. on Computer Aided Design, Vol. 19, pp.550--559, 2000.
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4
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5
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6
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K. Agarwal, T.Sato, Y.Cao, D.Slyvester, and C.Hu, Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis, Proc. of 4th Int. Symposium of Quality Electronic Design (ISQED), 2003.
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7
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8
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T.M. Mak, A. Kristic, K-T. Cheng, L-C. Wang, New Challenges in Delay Testing of Nanometer Multigigahertz Designs, IEEE CASS, 2004.
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9
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|
| |
10
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|
 |
11
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Jing-Jia Liou , Kwang-Ting Cheng , Sandip Kundu , Angela Krstic, Fast statistical timing analysis by probabilistic event propagation, Proceedings of the 38th conference on Design automation, p.661-666, June 2001, Las Vegas, Nevada, United States
[doi> 10.1145/378239.379043]
|
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12
|
J. H. Friedman. Multivariate adaptive regression splines, Annals of Statistics, Vol. 19, pp. 1--14, 1991.
|
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13
|
|
 |
14
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|
| |
15
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L.C. Wang, J. Liou, K-T. Cheng, Critical Path Selection for Delay Fault Testing Based on Statistical Timing Model, IEEE Tran. on Computer Aided Design for Integrated Circuits and Systems, Vol. 23, pp. 1550--1565, 2004.
|
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16
|
|
 |
17
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C. Visweswariah , K. Ravindran , K. Kalafala , S. G. Walker , S. Narayan, First-order incremental block-based statistical timing analysis, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
[doi> 10.1145/996566.996663]
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18
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B. Stine, et al. A Closed-Form Analytic Modek for ILD Thickness Variation in CMP Processes, Proc. CMP-MIC, Santa Clara, CA, Feb, 1997.
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