| Assessment of the NIST shop data model as a neutral file format |
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Winter Simulation Conference
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Proceedings of the 38th conference on Winter simulation
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Monterey, California
SESSION: Modeling methodology a: modeling methodologies for manufacturing and business
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Pages: 941 - 946
Year of Publication: 2006
ISBN:1-4244-0501-7
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Winter Simulation Conference
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Downloads (6 Weeks): 11, Downloads (12 Months): 179, Citation Count: 1
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ABSTRACT
This paper evaluates the shop data model (SDM) being developed by the National Institute of Standards and Technology (NIST) in terms of its viability as a neutral file format (NFF) for the discrete-event simulation (DES) of manufacturing systems. ProModel simulation software served as the test case for this evaluation. Observations are also provided regarding the challenges that simulation vendors might encounter when implementing the proposed NIST SDM. This paper shows that the NIST SDM doesn't pose any limitations which would prevent it from syntactically representing a manufacturing simulation model, however, it is not without certain challenges and difficulties. While only 28% of the ProModel data elements are currently supported by the SDM, future enhancements to the SDM should allow the information model to serve as a foundation upon which a common information model and NFF for the DES industry could be built.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Harward, G. (2005) Suitability of the NIST Shop Data Model as a Neutral File Format for Simulation. Thesis Brigham Young University, 2005. Available at: http://contentdm.lib.byu.edu/ETD/image/etd899.pdf.
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Charles McLean , Swee Leong , Charley Harrell , Philomena M. Zimmerman , Roberto F. Lu, Simulation standards: current status, needs, future directions, panel: simulation standards: current status, needs, and future directions, Proceedings of the 35th conference on Winter simulation: driving innovation, December 07-10, 2003, New Orleans, Louisiana
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