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Optimal edge detector design I: parameter selection and noise effects
Source IEEE Transactions on Pattern Analysis and Machine Intelligence archive
Volume 8 ,  Issue 2  (March 1986) table of contents
Pages: 164 - 177  
Year of Publication: 1986
ISSN:0162-8828
Authors
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 6
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cited by   index terms   collaborative colleagues  

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DOI Bookmark: 10.1109/TPAMI.1986.4767770


Collaborative Colleagues:
W H H J Lunscher: colleagues
M P Beddoes: colleagues