Optimal edge detector design I: parameter selection and noise effects

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Optimal edge detector design I: parameter selection and noise effects

Source

IEEE Transactions on Pattern Analysis and Machine Intelligence archive
Volume 8 , Issue 2 (March 1986) table of contents

Pages: 164 - 177

Year of Publication: 1986

ISSN:0162-8828

Authors

W H H J Lunscher
M P Beddoes

Publisher

IEEE Computer Society Washington, DC, USA

Bibliometrics

Downloads (6 Weeks): n/a, Downloads (12 Months): n/a, Citation Count: 6

Additional Information:

cited by index terms collaborative colleagues

Tools and Actions:	Review this Article Save this Article to a Binder Display Formats: BibTeX EndNote ACM Ref

DOI Bookmark:	10.1109/TPAMI.1986.4767770

CITED BY 6

	P. W. Verbeek , L. J. van Vliet, On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.16 n.7, p.726-733, July 1994
	Kenji Suzuki , Isao Horiba , Noboru Sugie, Neural Edge Enhancer for Supervised Edge Enhancement from Noisy Images, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.25 n.12, p.1582-1596, December 2003
	Shang-Hong Lai , Chang-Wu Fu , Shyang Chang, A Generalized Depth Estimation Algorithm with a Single Image, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.14 n.4, p.405-411, April 1992
	W. L. van Warmerdam , V. R. Algazi, Describing 1-D Intensity Transitions with Gaussian Derivatives at the Resolutions Matching the Transition Widths, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.11 n.9, p.973-977, September 1989
	A. C. Bovik , M. Clark , W. S. Geisler, Multichannel Texture Analysis Using Localized Spatial Filters, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.12 n.1, p.55-73, January 1990
	H. D. Tagare , R. J. P. deFigueiredo, On the Localization Performance Measure and Optimal Edge Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.12 n.12, p.1186-1190, December 1990