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Cost-efficient soft error protection for embedded microprocessors
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Source International Conference on Compilers, Architecture and Synthesis for Embedded Systems archive
Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems table of contents
Seoul, Korea
SESSION: Robustness table of contents
Pages: 421 - 431  
Year of Publication: 2006
ISBN:1-59593-543-6
Authors
Jason A. Blome  University of Michigan-Ann Arbor, MI
Shantanu Gupta  University of Michigan-Ann Arbor, MI
Shuguang Feng  University of Michigan-Ann Arbor, MI
Scott Mahlke  University of Michigan-Ann Arbor, MI
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
SIGBED: ACM Special Interest Group on Embedded Systems
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 14,   Downloads (12 Months): 62,   Citation Count: 3
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ABSTRACT

Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety critical applications, ranging from automobiles to pacemakers, compounds the importance of addressing the soft error problem. Historically, soft error tolerance techniques have been targeted mainly at high-end server markets, leading to solutions such as coarse-grained modular redundancy and redundant multithreading. However, these techniques tend to be prohibitively expensive to implement in the embedded design space. To address this problem, we first present a thorough analysis of the effects of soft errors on a production-grade, fully synthesized implementation of an ARM926EJ-S embedded microprocessor. We then leverage this analysis in the design of two orthogonal low-costs of terror protection techniques that can be tuned to achieve variable levels of fault coverage as a function of area and power constraints. The first technique uses a small cache of live register values in order to provide nearly twice the fault coverage of a register file protected using traditional error correcting codes at little or no additional area cost. The second technique is a statistical method used to significantly reduce the overhead of deploying time-delayed shadow latches for low-latency fault detection.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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ARM Ltd. ARM926EJ-S Technical Reference Manual, Jan. 2004. http://www.arm.com/pdfs/DDI0198D926TRM.pdf.
 
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Collaborative Colleagues:
Jason A. Blome: colleagues
Shantanu Gupta: colleagues
Shuguang Feng: colleagues
Scott Mahlke: colleagues