| Cost-efficient soft error protection for embedded microprocessors |
| Full text |
Pdf
(302 KB)
|
| Source
|
International Conference on Compilers, Architecture and Synthesis for Embedded Systems
archive
Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems
table of contents
Seoul, Korea
SESSION: Robustness
table of contents
Pages: 421 - 431
Year of Publication: 2006
ISBN:1-59593-543-6
|
|
Authors
|
|
| Sponsors |
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 14, Downloads (12 Months): 62, Citation Count: 3
|
|
|
ABSTRACT
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety critical applications, ranging from automobiles to pacemakers, compounds the importance of addressing the soft error problem. Historically, soft error tolerance techniques have been targeted mainly at high-end server markets, leading to solutions such as coarse-grained modular redundancy and redundant multithreading. However, these techniques tend to be prohibitively expensive to implement in the embedded design space. To address this problem, we first present a thorough analysis of the effects of soft errors on a production-grade, fully synthesized implementation of an ARM926EJ-S embedded microprocessor. We then leverage this analysis in the design of two orthogonal low-costs of terror protection techniques that can be tuned to achieve variable levels of fault coverage as a function of area and power constraints. The first technique uses a small cache of live register values in order to provide nearly twice the fault coverage of a register file protected using traditional error correcting codes at little or no additional area cost. The second technique is a statistical method used to significantly reduce the overhead of deploying time-delayed shadow latches for low-latency fault detection.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
ARM Ltd. ARM926EJ-S Technical Reference Manual, Jan. 2004. http://www.arm.com/pdfs/DDI0198D926TRM.pdf.
|
| |
2
|
|
| |
3
|
|
| |
4
|
David Bernick , Bill Bruckert , Paul Del Vigna , David Garcia , Robert Jardine , Jim Klecka , Jim Smullen, NonStop® Advanced Architecture, Proceedings of the 2005 International Conference on Dependable Systems and Networks (DSN'05), p.12-21, June 28-July 01, 2005
[doi> 10.1109/DSN.2005.70]
|
| |
5
|
S. Das, D. Roberts, S. Lee, S. Pant, D. Blaauw, T. Austin, K. Flautner, and T. Mudge. A self-tuning dvs process or using delay-error detection and correction. IEEE Journal of Solid-State Circuits, 41(4):792--804, 2006.
|
| |
6
|
P. Franco and E. J. McCluskey. On-line delay testing of digital circuits. In Proc. of the 1994 IEEE VLSI Test Symposium, pages 167--173, 1994.
|
| |
7
|
M. Y. Hsiao. A class of optimal minimum odd-weight-column sec-ded codes. IBM Journal of Research and Development, 14(4):395--401, 1970.
|
| |
8
|
|
| |
9
|
Chunho Lee , Miodrag Potkonjak , William H. Mangione-Smith, MediaBench: a tool for evaluating and synthesizing multimedia and communicatons systems, Proceedings of the 30th annual ACM/IEEE international symposium on Microarchitecture, p.330-335, December 01-03, 1997, Research Triangle Park, North Carolina, United States
|
| |
10
|
|
| |
11
|
|
| |
12
|
|
 |
13
|
|
| |
14
|
|
| |
15
|
|
| |
16
|
|
| |
17
|
L. Spainhower and T. Gregg. IBMS/390 Parallel Enterprise Server G5 Fault Tolerance: A Historical Perspective. IBM Journal of Research and Development, 43(6):863--873, 1999.
|
| |
18
|
|
| |
19
|
|
CITED BY 3
|
|
|
|
|
David Atienza , Giovanni De Micheli , Luca Benini , José L. Ayala , Pablo G. Del Valle , Michael DeBole , Vijay Narayanan, Reliability-aware design for nanometer-scale devices, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea
|
|
|
|
|