ACM Home Page
Please provide us with feedback. Feedback
OOPSLA'06 workshop outline: 1st workshop on model-based testing and object-oriented systems (M-TOOS)
Full text PdfPdf (156 KB)
Source Dynamic Languages Symposium archive
Companion to the 21st ACM SIGPLAN symposium on Object-oriented programming systems, languages, and applications table of contents
Portland, Oregon, USA
WORKSHOP SESSION: OOPSLA 2006 workshop chair's welcome table of contents
Pages: 621 - 621  
Year of Publication: 2006
ISBN:1-59593-491-X
Authors
Wolfgang Grieskamp  Microsoft Research, Redmond, WA
Debra Richardson  University of California - Irvine, Irvine, CA
Clay E. Williams  IBM T.J. Watson Research Center, Hawthorne, NY
Sponsors
SIGPLAN: ACM Special Interest Group on Programming Languages
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 29,   Citation Count: 0
Additional Information:

abstract   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1176617.1176637
What is a DOI?

ABSTRACT

Model-based testing of systems has long been a goal of the testing research community, and many paradigms have been proposed and developed. However, while model-based testing approaches are successfully used in industry, they have yet to be adopted as mainstream practices. This workshop explored the impact of object-orientation on model-based testing, as it affects both the creation of test generation tools, and the application of tools to object-oriented systems. Our primary purpose was to identify the key challenges to widespread use of model-based testing approaches for testing object oriented software, and to determine possible ways that object-orientation (and related approaches) may be helpful in overcoming these challenges.


Collaborative Colleagues:
Wolfgang Grieskamp: colleagues
Debra Richardson: colleagues
Clay E. Williams: colleagues