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Towards unbiased end-to-end network diagnosis
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Source Applications, Technologies, Architectures, and Protocols for Computer Communication archive
Proceedings of the 2006 conference on Applications, technologies, architectures, and protocols for computer communications table of contents
Pisa, Italy
SESSION: Measurement table of contents
Pages: 219 - 230  
Year of Publication: 2006
ISBN:1-59593-308-5
Also published in ...
Authors
Yao Zhao  Northwestern University
Yan Chen  Northwestern University
David Bindel  University of California at Berkeley
Sponsors
SIGCOMM: ACM Special Interest Group on Data Communication
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Internet fault diagnosis is extremely important for end users, overlay network service providers (like Akamai [1]) and even Internet service providers (ISPs). However, because link-level properties cannot be uniquely determined from end-to-end measurements, the accuracy of existing statistical diagnosis approaches is subject to uncertainty from statistical assumptions about the network. In this paper, we propose a novel Least-biased End-to-end Network Diagnosis (in short, LEND) system for inferring link-level properties like loss rate. We define a minimal identifiable link sequence (MILS) as a link sequence of minimal length whose properties can be uniquely identified from end-to-end measurements. We also design efficient algorithms to find all the MILSes and infer their loss rates for diagnosis. Our LEND system works for any network topology and for both directed and undirected properties, and incrementally adapts to network topology and property changes. It gives highly accurate estimates of the loss rates of MILSes, as indicated by both extensive simulations and Internet experiments. Furthermore, we demonstrate that such diagnosis can be achieved with fine granularity and in near real-time even for reasonably large overlay networks. Finally, LEND can supplement existing statistical inference approaches and provide smooth tradeoff between diagnosis accuracy and granularity.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Yao Zhao: colleagues
Yan Chen: colleagues
David Bindel: colleagues