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Learning the unified kernel machines for classification
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Source International Conference on Knowledge Discovery and Data Mining archive
Proceedings of the 12th ACM SIGKDD international conference on Knowledge discovery and data mining table of contents
Philadelphia, PA, USA
SESSION: Research track papers table of contents
Pages: 187 - 196  
Year of Publication: 2006
ISBN:1-59593-339-5
Authors
Steven C. H. Hoi  Chinese University of Hong Kong
Michael R. Lyu  Chinese University of Hong Kong
Edward Y. Chang  University of California, Santa Barbara
Sponsors
ACM: Association for Computing Machinery
SIGKDD: ACM Special Interest Group on Knowledge Discovery in Data
SIGMOD: ACM Special Interest Group on Management of Data
Publisher
ACM  New York, NY, USA
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ABSTRACT

Kernel machines have been shown as the state-of-the-art learning techniques for classification. In this paper, we propose a novel general framework of learning the Unified Kernel Machines (UKM) from both labeled and unlabeled data. Our proposed framework integrates supervised learning, semi-supervised kernel learning, and active learning in a unified solution. In the suggested framework, we particularly focus our attention on designing a new semi-supervised kernel learning method, i.e., Spectral Kernel Learning (SKL), which is built on the principles of kernel target alignment and unsupervised kernel design. Our algorithm is related to an equivalent quadratic programming problem that can be efficiently solved. Empirical results have shown that our method is more effective and robust to learn the semi-supervised kernels than traditional approaches. Based on the framework, we present a specific paradigm of unified kernel machines with respect to Kernel Logistic Regresions (KLR), i.e., Unified Kernel Logistic Regression (UKLR). We evaluate our proposed UKLR classification scheme in comparison with traditional solutions. The promising results show that our proposed UKLR paradigm is more effective than the traditional classification approaches.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Steven C. H. Hoi: colleagues
Michael R. Lyu: colleagues
Edward Y. Chang: colleagues