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Application of built-in-testing in component-based embedded systems
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Source International Symposium on Software Testing and Analysis archive
Proceedings of the ISSTA 2006 workshop on Role of software architecture for testing and analysis table of contents
Portland, Maine
Pages: 51 - 52  
Year of Publication: 2006
ISBN:1-59593-459-6
Authors
Irena Pavlova  Sofia University, Sofia, Bulgaria
Mikael Åkerholm  Mälardalen University, Västerås, Sweden
Johan Fredriksson  Mälardalen University, Västerås, Sweden
Publisher
ACM  New York, NY, USA
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ABSTRACT

This work-in-progress paper discusses challenges with application of Built-In Testing (BIT) in component-based embedded-systems. Testing constitutes a large part of the time and budget in development of embedded software systems. Such systems are often mission-critical, making testing highly important, and at the same time testing embedded systems is challenging because of their limited observability. We investigate the possible application of BIT in components for embedded systems, as a technique to advance the technology and knowledge for analysis and verification of functional correctness, real-time behavior, safety, and reliability of these systems.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Åkerholm and I. Pavlova and J. Fredriksson Application of Built-In-Testing in Component-Based Embedded Systems. Technical report, Malardalen university, 2006, May http://www.mrtc.mdh.se/publications/1125.pdf
 
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Component+ EU FP5 Project 2006, http://www.component-plus.org
 
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Collaborative Colleagues:
Irena Pavlova: colleagues
Mikael Åkerholm: colleagues
Johan Fredriksson: colleagues