Power grid physics and implications for CAD

ABSTRACT

Much research has been done lately concerning analysis and optimization techniques for on-chip power grid networks.However, all of these approaches assume a particular model or behavior of the power delivery.In this paper, we describe the first detailed full-die dynamic model of an industrial microprocessor design, including package and non-uniform decap distribution.This model is justified from the ground up using a full-wave model and then increasingly larger but less detailed models with only the irrelevant elements removed.Using these models we show that there is little impact of on-die inductance in such a design, and that the package is critical to understanding resonant properties of the grid.We also show that transient effects are sensitive to non-uniform de-cap distribution and that locality is a tight function of frequency and of the package-die resonance, producing newly explained localized resonant effects.Specifically, all of these points have impact on what kind of analysis and optimization are required from CAD.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.2 Performance Analysis and Design Aids

General Terms:
Reliability, Verification

Keywords:
IR, Ldi/dt, decap, locality, power supply networks, resonance