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A fast simultaneous input vector generation and gate replacement algorithm for leakage power reduction
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 43rd annual Design Automation Conference table of contents
San Francisco, CA, USA
SESSION: Session 8: leakage, power analysis and optimization table of contents
Pages: 117 - 120  
Year of Publication: 2006
ISBN:1-59593-381-6
Authors
Lei Cheng  University of Illinois at Urbana-Champaign
Liang Deng  University of Illinois at Urbana-Champaign
Deming Chen  University of Illinois at Urbana-Champaign
Martin D. F. Wong  University of Illinois at Urbana-Champaign
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Input vector control (IVC) technique is based on the observation that the leakage current in a CMOS logic gate depends on the gate input state, and a good input vector is able to minimize the leakage when the circuit is in the sleep mode. The gate replacement technique is a very effective method to further reduce the leakage current. In this paper, we propose a fast algorithm to find a low leakage input vector with simultaneous gate replacement. Results on MCNC91 benchmark circuits show that our algorithm produces $14 %$ better leakage current reduction with several orders of magnitude speedup in runtime for large circuits compared to the previous state-of-the-art algorithm. In particular, the average runtime for the ten largest combinational circuits has been dramatically reduced from 1879 seconds to 0.34 seconds.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Collaborative Colleagues:
Lei Cheng: colleagues
Liang Deng: colleagues
Deming Chen: colleagues
Martin D. F. Wong: colleagues