| A fast simultaneous input vector generation and gate replacement algorithm for leakage power reduction |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 43rd annual Design Automation Conference
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San Francisco, CA, USA
SESSION: Session 8: leakage, power analysis and optimization
table of contents
Pages: 117 - 120
Year of Publication: 2006
ISBN:1-59593-381-6
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Downloads (6 Weeks): 10, Downloads (12 Months): 28, Citation Count: 4
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ABSTRACT
Input vector control (IVC) technique is based on the observation that the leakage current in a CMOS logic gate depends on the gate input state, and a good input vector is able to minimize the leakage when the circuit is in the sleep mode. The gate replacement technique is a very effective method to further reduce the leakage current. In this paper, we propose a fast algorithm to find a low leakage input vector with simultaneous gate replacement. Results on MCNC91 benchmark circuits show that our algorithm produces $14 %$ better leakage current reduction with several orders of magnitude speedup in runtime for large circuits compared to the previous state-of-the-art algorithm. In particular, the average runtime for the ten largest combinational circuits has been dramatically reduced from 1879 seconds to 0.34 seconds.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 4
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Kanupriya Gulati , Nikhil Jayakumar , Sunil P. Khatri , D. M. H. Walker, A probabilistic method to determine the minimum leakage vector for combinational designs in the presence of random PVT variations, Integration, the VLSI Journal, v.41 n.3, p.399-412, May, 2008
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