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Using patterns in the automatic marking of ER-diagrams
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Source Annual Joint Conference Integrating Technology into Computer Science Education archive
Proceedings of the 11th annual SIGCSE conference on Innovation and technology in computer science education table of contents
Bologna, Italy
SESSION: Assessment table of contents
Pages: 83 - 87  
Year of Publication: 2006
ISBN:1-59593-055-8
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Authors
Pete Thomas  Open University, Milton Keynes, UK
Kevin Waugh  Open University, Milton Keynes, UK
Neil Smith  Open University, Milton Keynes, UK
Sponsors
SIGCSE: ACM Special Interest Group on Computer Science Education
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

This paper illustrates how the notion of pattern can be used in the automatic analysis and synthesis of diagrams, applied particularly to the automatic marking of ER-diagrams. The paper describes how diagram patterns fit into a general framework for diagram interpretation and provides examples of how patterns can be exploited in other fields. Diagram patterns are defined and specified within the area of ER-diagrams. The paper also shows how patterns are being exploited in a revision tool for understanding ER-diagrams.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Pete Thomas: colleagues
Kevin Waugh: colleagues
Neil Smith: colleagues