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Iterated snap rounding with bounded drift
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Source Annual Symposium on Computational Geometry archive
Proceedings of the twenty-second annual symposium on Computational geometry table of contents
Sedona, Arizona, USA
SESSION: Session 10 (wednesday, june 7th--10:40 am-12:00 pm) table of contents
Pages: 367 - 376  
Year of Publication: 2006
ISBN:1-59593-340-9
Author
Eli Packer  Stony Brook University, Stony Brook, NY
Sponsors
ACM: Association for Computing Machinery
SIGACT: ACM Special Interest Group on Algorithms and Computation Theory
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 3,   Downloads (12 Months): 18,   Citation Count: 3
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ABSTRACT

Snap Rounding and its variant, Iterated Snap Rounding, are methods for converting arbitrary-precision arrangements of segments into a fixed-precision representation (we call them SR and ISR for short). Both methods approximate each original segment by a polygonal chain, and both may lead, for certain inputs, to rounded arrangements with undesirable properties: in SR the distance between a vertex and a non-incident edge of the rounded arrangement can be extremely small, inducing potential degeneracies. In ISR, a vertex and a non-incident edge are well separated, but the approximating chain may drift far away from the original segment it approximates. We propose a new variant, Iterated Snap Rounding with Bounded Drift, which overcomes these two shortcomings of the earlier methods. The new solution augments ISR with simple and efficient procedures that guarantee the quality of the geometric approximation of the original segments, while still maintaining the property that a vertex and a non-incident edge in the rounded arrangement are well separated. We investigate the properties of the new method and compare it with the earlier variants. We have implemented the new scheme on top of CGAL, the Computational Geometry Algorithms Library, and report on experimental results.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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