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Experiences and results from initiating field defect prediction and product test prioritization efforts at ABB Inc.
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Source International Conference on Software Engineering archive
Proceedings of the 28th international conference on Software engineering table of contents
Shanghai, China
SESSION: Experience papers: risk analysis table of contents
Pages: 413 - 422  
Year of Publication: 2006
ISBN:1-59593-375-1
Authors
Paul Luo Li  Carnegie Mellon University, Pittsburgh, PA
James Herbsleb  Carnegie Mellon University, Pittsburgh, PA
Mary Shaw  Carnegie Mellon University, Pittsburgh, PA
Brian Robinson  ABB, Inc, Wickliffe, OH
Sponsors
ACM: Association for Computing Machinery
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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ABSTRACT

Quantitatively-based risk management can reduce the risks associated with field defects for both software producers and software consumers. In this paper, we report experiences and results from initiating risk-management activities at a large systems development organization. The initiated activities aim to improve product testing (system/integration testing), to improve maintenance resource allocation, and to plan for future process improvements. The experiences we report address practical issues not commonly addressed in research studies: how to select an appropriate modeling method for product testing prioritization and process improvement planning, how to evaluate accuracy of predictions across multiple releases in time, and how to conduct analysis with incomplete information. In addition, we report initial empirical results for two systems with 13 and 15 releases. We present prioritization of configurations to guide product testing, field defect predictions within the first year of deployment to aid maintenance resource allocation, and important predictors across both systems to guide process improvement planning. Our results and experiences are steps towards quantitatively-based risk management.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Paul Luo Li: colleagues
James Herbsleb: colleagues
Mary Shaw: colleagues
Brian Robinson: colleagues