| Improving test suites for efficient fault localization |
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International Conference on Software Engineering
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Proceedings of the 28th international conference on Software engineering
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Shanghai, China
SESSION: Research papers: test & analysis I
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Pages: 82 - 91
Year of Publication: 2006
ISBN:1-59593-375-1
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Downloads (6 Weeks): 24, Downloads (12 Months): 115, Citation Count: 6
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ABSTRACT
The need for testing-for-diagnosis strategies has been identified for a long time, but the explicit link from testing to diagnosis (fault localization) is rare. Analyzing the type of information needed for efficient fault localization, we identify the attribute (called Dynamic Basic Block) that restricts the accuracy of a diagnosis algorithm. Based on this attribute, a test-for-diagnosis criterion is proposed and validated through rigorous case studies: it shows that a test suite can be improved to reach a high level of diagnosis accuracy. So, the dilemma between a reduced testing effort (with as few test cases as possible) and the diagnosis accuracy (that needs as much test cases as possible to get more information) is partly solved by selecting test cases that are dedicated to diagnosis.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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