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On the relation between simulation-based and SAT-based diagnosis
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Semi-formal validation methods table of contents
Pages: 1139 - 1144  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Görschwin Fey  University of Bremen, Bremen, Germany
Sean Safarpour  University of Toronto, Toronto, Ontario, Canada
Andreas Veneris  University of Toronto, Toronto, Ontario, Canada
Rolf Drechsler  University of Bremen, Bremen, Germany
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

The problem of diagnosis -- or locating the source of an error or fault -- occurs in several areas of computer aided design, such as dynamic verification, property checking, equivalence checking and production test. Manually locating errors can be a time consuming and resource-intensive process. Several automated approaches for diagnosis have been presented, among them are simulation-based and SAT-based techniques. These two approaches are found to be robust even for large circuits as well as being applicable to a broad range of diagnosis problems. An in-depth comparison of both approaches necessary to augment our knowledge of diagnosis procedures has not been addressed by previous work.This paper provides a thorough analysis of the similarities and differences between simulation-based and SAT-based procedures for diagnosis. The relation between the basic approaches is theoretically analyzed. Issues regarding performance and diagnosis quality (resolution) are discussed. Experimental data strengthens the theoretical results. This detailed understanding of the relations between the techniques is necessary to provide further improvements to the field of diagnosis. The initial steps towards building a hybrid technique are also presented.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Görschwin Fey: colleagues
Sean Safarpour: colleagues
Andreas Veneris: colleagues
Rolf Drechsler: colleagues