| On the relation between simulation-based and SAT-based diagnosis |
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Design, Automation, and Test in Europe
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Proceedings of the conference on Design, automation and test in Europe: Proceedings
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Munich, Germany
SESSION: Semi-formal validation methods
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Pages: 1139 - 1144
Year of Publication: 2006
ISBN:3-9810801-0-6
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Authors
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Görschwin Fey
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University of Bremen, Bremen, Germany
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Sean Safarpour
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University of Toronto, Toronto, Ontario, Canada
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Andreas Veneris
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University of Toronto, Toronto, Ontario, Canada
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Rolf Drechsler
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University of Bremen, Bremen, Germany
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European Design and Automation Association
3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 4, Downloads (12 Months): 23, Citation Count: 0
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ABSTRACT
The problem of diagnosis -- or locating the source of an error or fault -- occurs in several areas of computer aided design, such as dynamic verification, property checking, equivalence checking and production test. Manually locating errors can be a time consuming and resource-intensive process. Several automated approaches for diagnosis have been presented, among them are simulation-based and SAT-based techniques. These two approaches are found to be robust even for large circuits as well as being applicable to a broad range of diagnosis problems. An in-depth comparison of both approaches necessary to augment our knowledge of diagnosis procedures has not been addressed by previous work.This paper provides a thorough analysis of the similarities and differences between simulation-based and SAT-based procedures for diagnosis. The relation between the basic approaches is theoretically analyzed. Issues regarding performance and diagnosis quality (resolution) are discussed. Experimental data strengthens the theoretical results. This detailed understanding of the relations between the techniques is necessary to provide further improvements to the field of diagnosis. The initial steps towards building a hybrid technique are also presented.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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