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An integrated scratch-pad allocator for affine and non-affine code
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Code and data layout optimisations for embedded software table of contents
Pages: 925 - 930  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Sumesh Udayakumaran  University of Maryland, College Park
Rajeev Barua  University of Maryland, College Park
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 4,   Downloads (12 Months): 20,   Citation Count: 4
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ABSTRACT

Scratch-Pad memory (SPM) allocators that exploit the presence of affine references to arrays are important for scientific benchmarks. On the other hand, such allocators have so far been limited in their general applicability. In this paper we propose an integrated scheme that for the first time combines the specialized solution for affine program allocation with a general framework for other code. We find that our integrated framework does as well or outperforms other allocators for a variety of SPM sizes.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Sumesh Udayakumaran: colleagues
Rajeev Barua: colleagues