Test and reliability challenges in automotive microelectronics

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Test and reliability challenges in automotive microelectronics

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Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents

Munich, Germany

SESSION: Test and reliability challenges in automotive microelectronics table of contents

Pages: 547 - 547

Year of Publication: 2006

ISBN:3-9810801-0-6

Authors

C. Sebeke	Robert Bosch GmbH, DE
C. Jung	BMW Group, DE
K. Harbich	Robert Bosch GmbH, DE
S. Fuchs	Credence Systems GmbH, DE
J. Schwarz	DaimlerChrysler AG, DE
P. Goehner	Stuttgart U, DE

Sponsors

: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society

Publisher

European Design and Automation Association 3001 Leuven, Belgium, Belgium

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abstract collaborative colleagues

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ABSTRACT

Absolutely fail-safe operation in any critical situation, highest reliability in day-to-day operation and best-in-class convenience at a reasonable price: all drive innovation in automotive electronics. These goals result in car systems with ever-increasing complexity, challenging every single component, IC and line of code. As electronics' failure rates are perceived to grow, we introduce root cause analysis, key technologies and new measures that enable carmakers to keep pace. The goal is to introduce test and reliability challenges and respective solutions for automotive systems. Representatives of car companies and suppliers will explain their views and practical experiences.

Collaborative Colleagues:

C. Sebeke: colleagues

C. Jung: colleagues

K. Harbich: colleagues

S. Fuchs: colleagues

J. Schwarz: colleagues

P. Goehner: colleagues

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