| Combining algorithm exploration with instruction set design: a case study in elliptic curve cryptography |
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Design, Automation, and Test in Europe
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Proceedings of the conference on Design, automation and test in Europe: Proceedings
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Munich, Germany
SESSION: Application-specific architectures
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Pages: 218 - 223
Year of Publication: 2006
ISBN:3-9810801-0-6
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Authors
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Johann Großschädl
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Graz University of Technology, Graz, Austria
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Paolo Ienne
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Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
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Laura Pozzi
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Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
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Stefan Tillich
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Graz University of Technology, Graz, Austria
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Ajay K. Verma
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Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
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European Design and Automation Association
3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 2, Downloads (12 Months): 19, Citation Count: 1
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ABSTRACT
In recent years, processor customization has matured to become a trusted way of achieving high performance with limited cost/energy in embedded applications. In particular, Instruction Set Extensions (ISEs) have been proven very effective in many cases. A large body of work exists today on creating tools that can select efficient ISEs given an application source code: ISE automation is crucial for increasing the productivity of design teams. In this paper we show that an additional motivation for automating the ISE process is to facilitate algorithm exploration: the availability of ISE can have a dramatic impact on the performance of different algorithmic choices to implement identical or equivalent functionality. System designers need fast feedbacks on the ISE-ability of various algorithmic flavors. We use a case study in elliptic curve (EC) cryptography to exemplify the following contributions: (1) ISE can reverse the relative performance of different algorithms for one and the same operation, and (2) automatic ISE, even without predicting speed-ups as precisely as detailed simulation can, is able to show exactly the trends that the designer should follow.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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