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EDA challenges in the converging application world
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Keynote addresses table of contents
Pages: 1 - 1  
Year of Publication: 2006
ISBN:3-9810801-0-6
Author
Rene Penning de Vries  SVP & CTO, Philips Semiconductors, The Netherlands
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

Whereas Moore's law continues to push the industry to ever more complex technologies (More Moore) supporting sophisticated digital applications, the so-called More than Moore technologies are finding more and more heterogeneous application domains. EDA challenges in More Moore are related to power optimisation, DfM and verification needs whereas the More than Moore technologies require EDA tools that relate various electrical, logical and physical domains in one environment. System level design is badly needed in More Moore and in More than Moore.

Collaborative Colleagues:
Rene Penning de Vries: colleagues