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Threshold/majority logic synthesis and concurrent error detection targeting nanoelectronic implementations
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Source Great Lakes Symposium on VLSI archive
Proceedings of the 16th ACM Great Lakes symposium on VLSI table of contents
Philadelphia, PA, USA
SESSION: Emerging technologies table of contents
Pages: 8 - 13  
Year of Publication: 2006
ISBN:1-59593-347-6
Authors
Rui Zhang  Princeton University, Princeton, NJ
Niraj K. Jha  Princeton University, Princeton, NJ
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Many nanometer-scale devices have been proposed and fabricated recently. Several can implement threshold and majority logic efficiently. Research has also begun on design methodologies to keep pace with the development of these devices. Specifically, a threshold logic synthesis tool (TELS) and a majority/minority logic synthesis tool (MALS) have been developed recently. In this paper, we discuss several factorization methods to enhance the efficacy of these two tools significantly. We then augment the design methodology to allow the tools to produce totally self-checking (TSC) circuits which can efficiently implement concurrent error detection. Such circuits can be used to detect run-time errors. Two schemes are used to synthesize TSC circuits - one based on the Berger code and the other on the parity code. We compare and contrast these two schemes. Experimental results establish the effectiveness of the proposed approaches.


REFERENCES

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