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Source Great Lakes Symposium on VLSI archive
Proceedings of the 16th ACM Great Lakes symposium on VLSI table of contents
Philadelphia, PA, USA
Pages: 1 - 1  
Year of Publication: 2006
ISBN:1-59593-347-6
Authors
Dan Page  Synopsys
Jamil Kawa  Synopsys
Charles Chiang  Synopsys
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 12,   Citation Count: 0
Additional Information:

abstract   index terms   collaborative colleagues  

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ABSTRACT

In this tutorial we will examine the process issues that are causing yield stability issues and how they will affect design flows for 65nm and below.


INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.1 Types and Design Styles
          Subjects: VLSI (very large scale integration)

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.2 Design Aids
  B.8 Performance and Reliability
      B.8.0 General


General Terms:
Design, Performance, Reliability

Collaborative Colleagues:
Dan Page: colleagues
Jamil Kawa: colleagues
Charles Chiang: colleagues

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