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Kansei: a testbed for sensing at scale
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Source Information Processing In Sensor Networks archive
Proceedings of the 5th international conference on Information processing in sensor networks table of contents
Nashville, Tennessee, USA
SESSION: SPOTS'06 session 2--sensor network testbeds table of contents
Pages: 399 - 406  
Year of Publication: 2006
ISBN:1-59593-334-4
Authors
Emre Ertin  The Ohio State University, Columbus, Ohio
Anish Arora  The Ohio State University, Columbus, Ohio
Rajiv Ramnath  The Ohio State University, Columbus, Ohio
Vinayak Naik  The Ohio State University, Columbus, Ohio
Sandip Bapat  The Ohio State University, Columbus, Ohio
Vinod Kulathumani  The Ohio State University, Columbus, Ohio
Mukundan Sridharan  The Ohio State University, Columbus, Ohio
Hongwei Zhang  The Ohio State University, Columbus, Ohio
Hui Cao  The Ohio State University, Columbus, Ohio
Mikhail Nesterenko  Kent State University, Kent, Ohio
Sponsor
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

The Kansei testbed at The Ohio State University is designed to facilitate research on networked sensing applications at scale. Kansei embodies a unique combination of characteristics as a result of its design focus on sensing and scaling: (i) Heterogeneous hardware infrastructure with dedicated node resources for local computation, storage, data exfiltration and back-channel communication, to support complex experimentation. (ii) Time accurate hybrid simulation engine for simulating substantially larger arrays using testbed hardware resources. (iii) High fidelity sensor data generation and real-time data and event injection. (iv) Software components and associated job control language to support complex multi-tier experiments utilizing real hardware resources and data generation and simulation engines. In this paper, we present the elements of Kansei testbed architecture, including its hardware and software platforms as well as its hybrid simulation and sensor data generation engines.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  19

Collaborative Colleagues:
Emre Ertin: colleagues
Anish Arora: colleagues
Rajiv Ramnath: colleagues
Vinayak Naik: colleagues
Sandip Bapat: colleagues
Vinod Kulathumani: colleagues
Mukundan Sridharan: colleagues
Hongwei Zhang: colleagues
Hui Cao: colleagues
Mikhail Nesterenko: colleagues