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On detecting edges
Source IEEE Transactions on Pattern Analysis and Machine Intelligence archive
Volume 8 ,  Issue 6  (November 1986) table of contents
Pages: 699 - 714  
Year of Publication: 1986
ISSN:0162-8828
Authors
V S Nalwa
T O Binford
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 39
Additional Information:

cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: 10.1109/TPAMI.1986.4767852

CITED BY  39
Mark A. Ruzon , Carlo Tomasi, Edge, Junction, and Corner Detection Using Color Distributions, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.23 n.11, p.1281-1295, November 2001
Xiangdong Liu , Roger W. Ehrich, Subpixel Edge Location in Binary Images Using Dithering, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.17 n.6, p.629-634, June 1995
Karl Rohr, On the Precision in Estimating the Location of Edges and Corners, Journal of Mathematical Imaging and Vision, v.7 n.1, p.7-22, Jan 1, 1997
P. Meer , B. Georgescu, Edge Detection with Embedded Confidence, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.23 n.12, p.1351-1365, December 2001
Qiuming Zhu, Improving edge detection by an objective edge evaluation, Proceedings of the 1992 ACM/SIGAPP Symposium on Applied computing: technological challenges of the 1990's, p.459-468, April 1992, Kansas City, Missouri, United States
D. Lee, Coping with Discontinuities in Computer Vision: Their Detection, Classification, and Measurement, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.12 n.4, p.321-344, April 1990
JunWei Han , Lei Guo, An algorithm for automatic detection of runways in aerial images, Machine Graphics & Vision International Journal, v.10 n.4, p.503-518, September 2001
W. L. van Warmerdam , V. R. Algazi, Describing 1-D Intensity Transitions with Gaussian Derivatives at the Resolutions Matching the Transition Widths, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.11 n.9, p.973-977, September 1989
Simon Baker , Shree K. Nayar , Hiroshi Murase, Parametric Feature Detection, International Journal of Computer Vision, v.27 n.1, p.27-50, March, 1998
K. Raghunath Rao , Jezekiel Ben-Arie, Optimal Edge Detection using Expansion Matching and Restoration, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.16 n.12, p.1169-1182, December 1994
Ming-Hua Chen , David Lee , Theo Pavlidis, Residual Analysis for Feature Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.13 n.1, p.30-40, January 1991
Hin Leong Tan , Saul B. Gelfand , Edward J. Delp, A Cost Minimization Approach to Edge Detection Using Simulated Annealing, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.14 n.1, p.3-18, January 1992
Yi Lu , Ramesh C. Jain, Reasoning About Edges in Scale Space, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.14 n.4, p.450-468, April 1992
E. R. Hancock , J. Kittler, Edge-Labeling Using Dictionary-Based Relaxation, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.12 n.2, p.165-181, February 1990
Zhiqian Wang , K. Raghunath Rao , Jezekiel Ben-Arie, Optimal Ramp Edge Detection Using Expansion Matching, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.18 n.11, p.1092-1097, November 1996
Robert Hanek , Michael Beetz, The Contracting Curve Density Algorithm: Fitting Parametric Curve Models to Images Using Local Self-Adapting Separation Criteria, International Journal of Computer Vision, v.59 n.3, p.233-258, September-October 2004
Narendra Ahuja, A Transform for Multiscale Image Segmentation by Integrated Edge and Region Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.18 n.12, p.1211-1235, December 1996
Shigeru Ando, Image Field Categorization and Edge/Corner Detection from Gradient Covariance, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.22 n.2, p.179-190, February 2000
Ramakrishna Kakarala , Alfred O. Hero, On Achievable Accuracy in Edge Localization, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.14 n.7, p.777-781, July 1992
E. de Micheli , B. Caprile , P. Ottonello , V. Torre, Localization and Noise in Edge Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.11 n.10, p.1106-1117, October 1989
Philippe Saint-Marc , Jer-Sen Chen , Gérard Medioni, Adaptive Smoothing: A General Tool for Early Vision, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.13 n.6, p.514-529, June 1991
Margaret M. Fleck, Multiple Widths Yield Reliable Finite Differences (Computer Vision), IEEE Transactions on Pattern Analysis and Machine Intelligence, v.14 n.4, p.412-429, April 1992
Maria Petrou , Josef Kittler, Optimal Edge Detectors for Ramp Edges, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.13 n.5, p.483-491, May 1991
Sudeep Sarkar , Kim L. Boyer, On Optimal Infinite Impulse Response Edge Detection Filters, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.13 n.11, p.1154-1171, November 1991
J. J. Clark, Authenticating Edges Produced by Zero-Crossing Algorithms, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.11 n.1, p.43-57, January 1989
H. D. Tagare , R. J. P. deFigueiredo, On the Localization Performance Measure and Optimal Edge Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.12 n.12, p.1186-1190, December 1990
D. I. Havelock, Geometric Precision in Noise-Free Digital Images, IEEE Transactions on Pattern Analysis and Machine Intelligence, v.11 n.10, p.1065-1075, October 1989
Punam Kumar Saha, Tensor scale: a local morphometric parameter with applications to computer vision and image processing, Computer Vision and Image Understanding, v.99 n.3, p.384-413, September 2005
Luhong Diao , Bin Yu , Hua Li, A new edge detector based on Fresnel diffraction, Pattern Recognition Letters, v.28 n.7, p.859-864, May, 2007
Giuseppe Papari , Patrizio Campisi , Nicolai Petkov , Alessandro Neri, A biologically motivated multiresolution approach to contour detection, EURASIP Journal on Applied Signal Processing, v.2007 n.1, p.119-119, 1 January 2007
A. A. Boguslavskii , S. M. Sokolov, Detecting objects in images in real-time computer vision systems using structured geometric models, Programming and Computing Software, v.32 n.3, p.177-187, May 2006
Suchendra M. Bhandarkar , Xia Zeng, Evolutionary Approaches to Figure-Ground Separation, Applied Intelligence, v.11 n.2, p.187-212, September-October 1999
Christian Drewniok , Karl Rohr, Model-Based Detection and Localization of Circular Landmarksin Aerial Images, International Journal of Computer Vision, v.24 n.3, p.187-217, Sept./Oct. 1997
Tony Lindeberg, Edge Detection and Ridge Detection with Automatic Scale Selection, International Journal of Computer Vision, v.30 n.2, p.117-156, Nov. 1998
R. Medina-Carnicer , F. J. Madrid-Cuevas, Unimodal thresholding for edge detection, Pattern Recognition, v.41 n.7, p.2337-2346, July, 2008
Alper Baştürk , Enis Günay, Efficient edge detection in digital images using a cellular neural network optimized by differential evolution algorithm, Expert Systems with Applications: An International Journal, v.36 n.2, p.2645-2650, March, 2009
Xiangyun Hu , Zuxun Zhang , Jonathan Li, Linear feature extraction using adaptive least-squares template matching and a scalable slope edge model, International Journal of Remote Sensing, v.30 n.13, p.3393-3407, January 2009
Genyun Sun , Qinhuo Liu , Qiang Liu , Changyuan Ji , Xiaowen Li, A novel approach for edge detection based on the theory of universal gravity, Pattern Recognition, v.40 n.10, p.2766-2775, October, 2007
Punam Kumar Saha, Tensor scale: A local morphometric parameter with applications to computer vision and image processing, Computer Vision and Image Understanding, v.99 n.3, p.384-413, September 2005

INDEX TERMS

Classification:
  I. Computing Methodologies
  I.4 IMAGE PROCESSING AND COMPUTER VISION
      I.4.6 Segmentation
          Subjects: Edge and feature detection


General Terms:
Design

Collaborative Colleagues:
V S Nalwa: colleagues
T O Binford: colleagues

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