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Exploiting temporal idleness to reduce leakage power in programmable architectures
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: Low power and special purpose FPGAs table of contents
Pages: 651 - 656  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Rajarshee P. Bharadwaj  University of Texas at Dallas
Rajan Konar  University of Texas at Dallas
Poras T. Balsara  University of Texas at Dallas
Dinesh Bhatia  University of Texas at Dallas
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

One of the biggest challenges that programmable devices like FPGAs are facing in ultra deep sub-micron regime is the exponential rise in leakage power consumption. As technology shrinks below 90nm, a new design paradigm has to evolve to tackle the issue of leakage power consumption. In this work we focus on a new design methodology for reducing leakage power by exploiting temporal locality in designs and accordingly group them into. clusters that can be switched on and off. We propose a Power State Controller based method, which controls the switching of the clusters from one state to another. We show our technique using Data Flow Graphs where temporal locality can be effectively explored. Our results show that substantial leakage savings can be achieved if temporal idleness of designs can be exploited effectively.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Rajarshee P. Bharadwaj: colleagues
Rajan Konar: colleagues
Poras T. Balsara: colleagues
Dinesh Bhatia: colleagues