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SoC test scheduling using the B-tree based floorplanning technique
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: Poster session III table of contents
Pages: 1188 - 1191  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Jen-Yi Wuu  National Taiwan University, Taipei, Taiwan
Tung-Chieh Chen  National Taiwan University, Taipei, Taiwan
Yao-Wen Chang  National Taiwan University, Taipei, Taiwan
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

We present in this paper a new algorithm to co-optimize the problems of test scheduling and core wrapper design under power constraints for core-based SoC (System on Chip) designs. The problem of test scheduling is first transformed into a floorplanning problem with a given maximum height (test access mechanism width) constraint. Then, we apply the B*-tree based floorplanning technique to solve the SoC test scheduling problem. Experimental results based on the ITC'02 benchmarks show that our method is very effective and efficient---our method obtains the best results ever reported for SoC test scheduling with power constraint in every efficient running time. Compared with recent works, our method achieves average improvements of 4.7% to 20.1%.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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K. Chakrabarty, "Test scheduling for core-based system using mixed-integer linear programming," IEEE TCAD, pp.1163--1174, 2000.
 
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S. Kirkpatrick, C. D. Gelatt, Jr., and M. P. Vecchi, "Optimization by simulated annealing," pp.671--680, Science, Vol.220, No.4598, 1983.
 
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E. J. Marinissen, V. Iyengar, and K. Chakrabarty. ITC'02 SoC Test Benchmarks, http://www.extra.research.philips.com/itc02socbenchm/
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Collaborative Colleagues:
Jen-Yi Wuu: colleagues
Tung-Chieh Chen: colleagues
Yao-Wen Chang: colleagues