| A novel wavelet method for noise analysis of nonlinear circuits |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2005 Asia and South Pacific Design Automation Conference
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Shanghai, China
SESSION: Analysis and simulation techniques
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Pages: 471 - 476
Year of Publication: 2005
ISBN:0-7803-8737-6
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Authors
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Xuan Zeng
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Fudan University, Shanghai, P.R. China
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Bank Liu
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Fudan University, Shanghai, P.R. China
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Jun Tao
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Fudan University, Shanghai, P.R. China
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Charles Chiang
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Synopsys Inc., Mountain View, CA
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Dian Zhou
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Fudan University, Shanghai, P.R. China and University of Texas at Dallas, Richardson, TX
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Downloads (6 Weeks): 2, Downloads (12 Months): 27, Citation Count: 0
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ABSTRACT
In this paper, a novel wavelet method is proposed for noise analysis of nonlinear circuits. Compared with the existing algorithms capable of accessing circuit performance in the present of noise, the proposed method presents several merits. First, it fully accounts for nonlinearities. Second, it can handle signals with continuous frequency spectra. Third, by taking advantage of the properties of the wavelet bases, such as local compactness and multi-resolution, it holds high simulation speed and high accuracy. Furthermore, an adaptive scheme exists to automatically select the wavelet basis functions for a desired accuracy. All these merits make the novel wavelet method outperforms its previous techniques.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/240518.240572]
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