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A novel wavelet method for noise analysis of nonlinear circuits
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: Analysis and simulation techniques table of contents
Pages: 471 - 476  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Xuan Zeng  Fudan University, Shanghai, P.R. China
Bank Liu  Fudan University, Shanghai, P.R. China
Jun Tao  Fudan University, Shanghai, P.R. China
Charles Chiang  Synopsys Inc., Mountain View, CA
Dian Zhou  Fudan University, Shanghai, P.R. China and University of Texas at Dallas, Richardson, TX
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this paper, a novel wavelet method is proposed for noise analysis of nonlinear circuits. Compared with the existing algorithms capable of accessing circuit performance in the present of noise, the proposed method presents several merits. First, it fully accounts for nonlinearities. Second, it can handle signals with continuous frequency spectra. Third, by taking advantage of the properties of the wavelet bases, such as local compactness and multi-resolution, it holds high simulation speed and high accuracy. Furthermore, an adaptive scheme exists to automatically select the wavelet basis functions for a desired accuracy. All these merits make the novel wavelet method outperforms its previous techniques.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Xuan Zeng: colleagues
Bank Liu: colleagues
Jun Tao: colleagues
Charles Chiang: colleagues
Dian Zhou: colleagues