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Opportunities and challenges for better than worst-case design
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: (Special session) CAD for microarchitecture designs table of contents
Pages: 2 - 7  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Todd Austin  The University of Michigan
Valeria Bertacco  The University of Michigan
David Blaauw  The University of Michigan
Trevor Mudge  The University of Michigan
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 53,   Citation Count: 2
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ABSTRACT

The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, uncertainty in environmental and fabrication conditions, and single-event upsets all conspire to compromise system correctness and reliability. Recently, researchers have begun to advocate a new design strategy called Better Than Worst-Case design that couples a complex core component with a simple reliable checker mechanism. By delegating the responsibility for correctness and reliability of the design to the checker, it becomes possible to build provably correct designs that effectively address the challenges of deep submicron design. In this paper, we present the concepts of Better Than Worst-Case design and high light two exemplary designs: the DIVA checker and Razor logic. We show how this approach to system implementation relaxes design constraints on core components, which reduces the effects of physical design challenges and creates opportunities to optimize performance and power characteristics. We demonstrate the advantages of relaxed design constraints for the core components by applying typical-case optimization (TCO) techniques to an adder circuit. Finally, we discuss the challenges and opportunities posed to CAD tools in the context of Better Than Worst-Case design. In particular, we describe the additional support required for analyzing run-time characteristics of designs and the many opportunities which are created to incorporate typical-case optimizations into synthesis and verification.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Overclockers.com website, overclockers forum. http://www.overclockers.com, 2004.
 
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A. Agarwal, V. Zolotov, and D. Blaauw. Statistical clock skew analysis considering intra-die process variations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23(8):1231--1242, Aug. 2004.
 
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C. Weaver, F. Gebara, T. Austin, and R. Brown. Remora: A dynamic self-tuning processor. UM Technical Report CSE-TR-460-02, July 2002.

Collaborative Colleagues:
Todd Austin: colleagues
Valeria Bertacco: colleagues
David Blaauw: colleagues
Trevor Mudge: colleagues