An efficient control-oriented coverage metric

ABSTRACT

Coverage metrics, which evaluate the ability of a test sequence to detect design faults, are essential to the validation process. A key source of difficulty in determining fault detection is that the control flow path traversed in the presence of a fault cannot be determined. Fault detection can only be accurately determined by exploring the set of all control flow paths, which may be traversed as a result of a fault. We present a coverage metric that determines the propagation of fault effects along all possible faulty control flow paths. The complexity of exploring multiple control flow paths is greatly alleviated by heuristically pruning infeasible control flow paths using the algorithm that we present. The proposed coverage metric provides high accuracy in designs that contain complex control flow. The results obtained are promising.

REFERENCES

• 1: Boris Beizer, Software testing techniques (2nd ed.), Van Nostrand Reinhold Co., New York, NY, 1990
• 2: K.-T. Cheng and J.-Y. Jou. A functional fault model for sequential machines. IEEE Transactions on Computer-Aided Design, 11(9):1065--1073, September 1992.
• 3: F. Corno , M. Sonza Reorda , G. Squillero , A. Manzone , A. Pincetti, Automatic test bench generation for validation of RT-level descriptions: an industrial experience, Proceedings of the conference on Design, automation and test in Europe, p.385-389, March 27-30, 2000, Paris, France [doi>10.1145/343647.343802]
• 4: Farzan Fallah , Srinivas Devadas , Kurt Keutzer, OCCOM: efficient computation of observability-based code coverage metrics for functional verification, Proceedings of the 35th annual conference on Design automation, p.152-157, June 15-19, 1998, San Francisco, California, United States [doi>10.1145/277044.277078]
• 5: Ghassan Al Hayek , Chantal Robach, From Specification Validation to Hardware Testing: A Unified Method, Proceedings of the IEEE International Test Conference on Test and Design Validity, p.885-893, October 20-25, 1996
• 6: K. N. King , A. Jefferson Offutt, A Fortran language system for mutation-based software testing, Software—Practice & Experience, v.21 n.7, p.685-718, July 1991 [doi>10.1002/spe.4380210704]
• 7: J. Laski and B. Korel. A data flow oriented program testing strategy. IEEE Trans. on Software Engineering, SE-9:33--43, 1983.
• 8: T. Lv, J. Fan, and X. Li. An efficient observability evaluation algorithm based on factored use-def chains. In Asian Test Symposium, pages 161--166, 2003.
• 9: Nadeem Malik , Steven Roberts , Alan Pita , Ryan Dobson, Automaton: An Autonomous Coverage-Based Multiprocessor System Verification Environment, Proceedings of the 8th International Workshop on Rapid System Prototyping (RSP '97) Shortening the Path from Specification to Prototype, p.168, June 24-26, 1997
• 10: Dinos Moundanos , Jacob A. Abraham , Yatin V. Hoskote, Abstraction Techniques for Validation Coverage Analysis and Test Generation, IEEE Transactions on Computers, v.47 n.1, p.2-14, January 1998 [doi>10.1109/12.656068]
• 11: Ranga Vemuri , Ravi Kalyanaraman, Generation of design verification tests from behavioral VHDL programs using path enumeration and constraint programming, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.3 n.2, p.201-214, June 1995 [doi>10.1109/92.386221]
• 12: A. von Mayhauser , T. Chen , J. Kok , C. Anderson , A. Read , A. Haijar, On choosing test criteria for behavioral level hardware design verification, Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00), p.124, November 08-10, 2000
• 13: Qiushuang Zhang , Ian G. Harris, A data flow fault coverage metric for validation of behavioral HDL descriptions, Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design, November 05-09, 2000, San Jose, California