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Efficient symbolic sensitivity analysis of analog circuits using element-coefficient diagrams
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: Simulation and modeling techniques for RF/analog circuits table of contents
Pages: 230 - 235  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Huiying Yang  University of Cincinnati, OH
Mukesh Ranjan  University of Cincinnati, OH
Wim Verhaegen  Katholieke University Leuven, Leuven, Belgium
Mengmeng Ding  University of Cincinnati, OH
Ranga Vemuri  University of Cincinnati, OH
Geoges Gielen  Katholieke University Leuven, Leuven, Belgium
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

This paper presents a new method to perform efficient first-order symbolic sensitivity analysis of analog circuits by direct differentiation of symbolic expressions stored as element-coefficient diagrams (ECDs). An ECD is a compact graphical representation of a symbolic transfer function. It is the cancellation-free and per-coefficient term generation version of determinant decision diagrams (DDDs). The symbolic sensitivity equations obtained from ECDs are stored as a sensitivity-ECDs(SECDs) and can be evaluated extremely fast as it inherits the properties of ECDs. The proposed methodology has been applied to the calculation of sensitivities of four benchmark circuits and it has been demonstrated to be as accurate and more efficient than numerical sensitivity analysis done by SPECTRE.


REFERENCES

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Collaborative Colleagues:
Huiying Yang: colleagues
Mukesh Ranjan: colleagues
Wim Verhaegen: colleagues
Mengmeng Ding: colleagues
Ranga Vemuri: colleagues
Geoges Gielen: colleagues