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Thermal-driven multilevel routing for 3-D ICs
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: Routing and interconnects table of contents
Pages: 121 - 126  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Jason Cong  UCLA Los Angeles, CA
Yan Zhang  UCLA Los Angeles, CA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

3-D IC has a great potential for improving circuit performance and degree of integration. It is also an attractive platform for system-on-chip or system-in-package solutions. A critical issue in 3-D circuit design is heat dissipation. In this paper we propose an efficient 3-D multilevel routing approach that includes a novel through-the-silicon via (TS-via) planning algorithm. The proposed approach features an adaptive lumped resistive thermal model and a two-step multilevel TS-via planning scheme. Experimental results show that with multilevel TS-via planning, the thermal-driven approach can reduce the maximum temperature to the required temperature with reasonable wirelength increase. Compared to a post processing approach for dummy TS-via insertion, to achieve the same required temperature, our approach uses 80% fewer TS-vias. To our knowledge, this proposed approach is the first thermal-driven 3-D routing algorithm.


REFERENCES

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CITED BY  16